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International Symposium for Testing and Failure Analysis 

Category Computer & IT  Computer & IT 

McEnery Convention Center 


San JoseUnited States

150 West San Carlos Street, San Jose, California, San Jose
15-11-2011  16-11-2011

Computer & IT 

International Symposium for Testing and Failure Analysis is an important event in the field of micro electronics failure analysis. The technological industry largely depends upon semiconductors, the microchips that power and control computers, automobiles, telephones and other devices and this show provides the best platform for professionals from the complete community of analysts and scientists to come together and exchange ideas.

Visitors: Technical symposia, user group discussions, seminars and short courses form the event highlights

Exhibitors: Scientists, engineers and engineering forms, research institutes, delegates from different countries willing to explore latest development all over, venture capitalists who would be looking forward to funding promising projects and entrepreneurs.



9639 Kinsman Road Materials Park, Ohio 44073-0002 USA, Cincinnati, United States
Phone +(1)-(440) 338-5151/(202) 737-3600   

Organizer Profile:

Business Services, Business Services, Business Services, Computer & IT, Computer & IT, Media & Advertising, Medical & Pharmaceutical, Metal & Minerals, Railway, Shipping & Aviation, Sporting Goods, Games & Toys

Posted by newsadmin | 11 May 2011, 00:16 | Trade Shows and Forums »

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